Conductive atomic force microscopy

Results: 11



#Item
1Chemistry / Conductive atomic force microscopy / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method

Mode Note Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM system

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Source URL: www.nanowerk.com

Language: English - Date: 2009-12-27 18:00:00
2Chemistry / Scanning tunneling microscope / Microscope / Nanotechnology / Scanning tunneling spectroscopy / Conductive atomic force microscopy / Scanning probe microscopy / Scientific method / Science

Mode Note Scanning Tunneling Microscopy (STM) Probing the Local Electronic Structure of a Sample’s Surface Scanning Tunneling Microscopy (STM) is one of the application modes for XE series SPM. STM is the ancestor of

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Source URL: www.nanowerk.com

Language: English - Date: 2009-12-27 18:00:00
3Microscopes / Chemistry / Scanning tunneling microscope / Intermolecular forces / Atomic force microscopy / Microscopy / Canton of Neuchâtel / Conductive atomic force microscopy / NanoWorld / Scanning probe microscopy / Science / Scientific method

Microsoft PowerPoint - ENGS-AFM [Compatibility Mode]

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Source URL: nanofab.caltech.edu

Language: English - Date: 2013-01-21 22:21:44
4Chemistry / Atomic force microscopy / Magnetic force microscope / Microscopy / Conductive atomic force microscopy / Scanning capacitance microscopy / Nanoindentation / Scanning tunneling microscope / Microscope / Scanning probe microscopy / Science / Scientific method

Dimension FastScan The World’s Fastest AFM Innovation with Integrity

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Source URL: www.nanowerk.com

Language: English - Date: 2013-10-28 06:25:22
5Chemistry / Atomic force microscopy / Magnetic force microscope / Microscopy / Scanning capacitance microscopy / Kelvin probe force microscope / Conductive atomic force microscopy / Vibrational analysis with scanning probe microscopy / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method

Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything is

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Source URL: www.ntmdt.com

Language: English - Date: 2015-02-26 06:24:56
6Chemistry / Atomic force microscopy / Magnetic force microscope / Microscopy / Scanning capacitance microscopy / Kelvin probe force microscope / Conductive atomic force microscopy / Vibrational analysis with scanning probe microscopy / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method

Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything is

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Source URL: ntmdt.com

Language: English - Date: 2015-02-26 06:24:56
7Emerging technologies / Physical quantities / Scanning probe microscopy / Graphene / Carbon nanotube / Thermal conductivity / Electrical resistivity and conductivity / Conductive atomic force microscopy / Solid / Chemistry / Physics / Nanomaterials

CrossMark_Color_Stacked_p

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Source URL: www.ntmdt.com

Language: English - Date: 2015-01-20 05:16:33
8Scientific method / Scanning tunneling microscope / Microscopy / Electron / Spectroscopy / Scanning tunneling spectroscopy / Conductive atomic force microscopy / Scanning probe microscopy / Physics / Science

Microsoft Word - 5_Lab_Unit_STM.doc

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Source URL: depts.washington.edu

Language: English - Date: 2009-07-20 14:30:48
9Condensed matter physics / Spin polarized scanning tunneling microscopy / Scanning tunneling microscope / Superparamagnetism / Magnetization reversal / Ferromagnetism / Magnetism / Magnetic force microscope / Conductive atomic force microscopy / Scanning probe microscopy / Physics / Materials science

The Schottky contact is a fundamental metal-semiconductor contact, and Schottky diodes are currently one of the few commerciall

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Source URL: www.materials.cmu.edu

Language: English - Date: 2010-08-28 11:56:56
10Materials science / Atomic force microscopy / Conductive atomic force microscopy / Local oxidation nanolithography / Force spectroscopy / Magnetic force microscope / Chemical force microscopy / Microscopy / Kelvin probe force microscope / Scanning probe microscopy / Chemistry / Science

j623 Index a acrylic acid – photopolymerization 282

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Source URL: www.wiley-vch.de

Language: English - Date: 2011-09-05 21:04:13
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